回路配線検査方法および回路配線検査装置

Method and device for inspecting circuit wire

Abstract

【課題】幹配線がレジスト膜で覆われているときでも回路配線の断線・短絡を検査する。 【解決手段】幹配線Mと枝配線P1,P2とを含む回路配線110を検査対象とする回路配線検査方法であって、電流検出抵抗12を含む電流発生器10を枝配線P1の反幹配線側端点P1yと枝配線P2の幹配線側端点P2xとの間に接続して電流Iを出力させると共に、電圧測定器20を枝配線P2の端点P2x,P2y間に接続し、枝配線P1の反幹配線側端点P1yと枝配線P2の幹配線側端点P2xとの間に出力されている電流Iが電流検出抵抗12で検出されないときには枝配線P1の反幹配線側端点P1yと枝配線P2の幹配線側端点P2xとの間に断線有りと判定し、電流Iが電圧測定器20で検出されたときには枝配線P1の端点P1x,P1y間と枝配線P2の端点P2x,P2y間との間に短絡有りと判定する。 【選択図】図1
<P>PROBLEM TO BE SOLVED: To provide a method and a device for inspecting circuit wire capable of inspecting disconnection and a short circuit of the circuit wire, even when the main wire is coated with a resist film. <P>SOLUTION: In this method of inspecting the circuit wire using the circuit wire 110 including the main wire M and branch wires P1 to P2 as an inspection object, a current generator 10 including a current-detecting resistance 12 is connected between an anti-main-wire side end point P1y of the branch wire P1 and a main wire side end point P2x of the branch wire P2 to output a current I; a voltage-measuring instrument 20 is connected between the end points P2x, P2y of the branch wire P2; the presence of the disconnection is determined between the anti-main-wire side end point P1y of the branch wire P1 and the main wire side end point P2x of the branch wire P2, when the current I output between the anti-main-wire side end point P1y of the branch wire P1 and the main wire side end point P2x of the branch wire P2 is not detected by the current-detecting resistance 12; and the presence of the short circuit is determined between a section between the end points P1x, P1y of the branch wire P1 and a section between the end points P2x, P2y of the branch wire P2, when the current I is detected by the voltage measuring instrument 20. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Claims

Description

Topics

Download Full PDF Version (Non-Commercial Use)

Patent Citations (6)

    Publication numberPublication dateAssigneeTitle
    JP-2000275295-AOctober 06, 2000Sharp Corp, シャープ株式会社電極パターン検査装置および電極パターン検査方法
    JP-2003255007-ASeptember 10, 2003Hioki Ee Corp, 日置電機株式会社回路配線検査方法およびその装置
    JP-H05343484-ADecember 24, 1993Oputo Syst:Kk, 株式会社オプト・システム回路パターン検査装置
    JP-H06148253-AMay 27, 1994Adtec Eng:Kk, 株式会社アドテックエンジニアリングApparatus and method for inspecting circuit pattern
    JP-H10283044-AOctober 23, 1998Asia Electron Inc, アジアエレクトロニクス株式会社Constant current power unit
    JP-S63262572-AOctober 28, 1988Matsushita Electric Ind Co LtdMethod for screening inspection of foil of printed circuit board

NO-Patent Citations (0)

    Title

Cited By (2)

    Publication numberPublication dateAssigneeTitle
    JP-2011512783-AApril 21, 2011メディパックス インコーポレイテッド治療用加圧システム
    JP-2012220275-ANovember 12, 2012Hioki Ee Corp, 日置電機株式会社Short-circuiting inspection apparatus and short-circuiting inspection method